--------------------
- 4H-SIC p-type doping determination from secondary electrons imaging hal link

Auteur(s): Kayambaki M, Makris N., Tsagarakis K., Peyre H., Stavrinidis A, Zekentes K.

Conference: 12th European Conference on Silicon Carbide and Related Materials (ECSCRM) (Birmingham, GB, 2018-09-02)


Ref HAL: hal-02066375_v1
Exporter : BibTex | endNote
Commentaires: session poster: MO.P.FP14