Auteur(s): Panov V.P., Vij J.K., Panarin Yu.P., Blanc C., Lorman V., Goodby J.W.
(Article) Publié:
Physical Review E: Statistical, Nonlinear, And Soft Matter Physics, vol. 75 p.042701 (2007)
Texte intégral en Openaccess : 
Ref HAL: hal-00378244_v1
PMID 17500942
DOI: 10.1103/PhysRevE.75.042701
WoS: 000246073900100
Exporter : BibTex | endNote
19 Citations
Résumé:
The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.
Commentaires: 4 pp.