We report on nonresonant detection of terahertz radiation using our original InGaP/InGaAs/GaAs plasmonresonant high-electron-mobility transistor having a dual grating gate (DGG) structure. The experiments were performed at room temperature using a Gunn diode operating at 0.30 THz as the THz source. Using a deviceloading model, the intrinsic responsivity was extracted and was dependent on the polarization of the incident THz wave. The device exhibited highest response when the electric-field vector of the incident THz radiation was directed in the source-drain direction. The 2D spatial distribution image of the transistor responsivity shows a clear beam focus centred on the transistor position, which proves the appropriate coupling of the THz radiation to the device, due to the DGG structure. The device also showed a high intrinsic responsivity of similar to 90 V/W and a noise equivalent power (NEP) as low as similar to 10-10 WHz(-0.5). (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Plasmonic terahertz detection by a double-grating gate field-effect transistor structure with an asymmetric unit cell is studied theoretically. Detection responsivity exceeding 8 kV/W at room temperature in the photovoltaic response mode is predicted for strong asymmetry of the structure unit cell. This value of the responsivity is an order of magnitude greater than reported previously for the other types of uncooled plasmonic terahertz detectors. Such enormous responsivity can be obtained without using any supplementary antenna elements because the double-grating gate acts as an aerial matched antenna that effectively couples the incoming terahertz radiation to plasma oscillations in the structure channel. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3670321]

This paper investigates terahertz detectors fabricated in a low-cost 130 nm silicon CMOS technology. We show that the detectors consisting of a nMOS field effect transistor as rectifying element and an integrated bow-tie coupling antenna achieve a record responsivity above 5 kV/W and a noise equivalent power below 10 pW/Hz(0.5) in the important atmospheric window around 300 GHz and at room temperature. We demonstrate furthermore that the same detectors are efficient for imaging in a very wide frequency range from similar to 0.27 THz up to 1.05 THz. These results pave the way towards high sensitivity focal plane arrays in silicon for terahertz imaging. (C) 2011 Optical Society of America

In this work we review the most important results concerning the physics and applications of FETs as Terahertz detectors [1]. We present two experiments showing: i) Terahertz detection based on low cost 130 nm silicon technology Field Effect Transistors in the sub-THz range (0.2 THz up to 1.1 THz) and ii) first results on detection by FETs of emission from 3.1 THz Quantum Cascade Lasers.

We study the broadband photovoltaic response of field effect transistors on terahertz radiation. A simple physical analytical model of the response is developed. It is based on plasma density perturbation in the transistor channel by the incoming terahertz radiation. The model shows how the non-resonant detection signal is related to static (dc) transistor characteristics. We analyze loading effects related to capacitive, inductive, and resistive coupling of the detector to the read-out circuit as a function of modulation frequencies and loading resistors. As we show, the proposed physical model completed by loading effects fully describes the experimental results on the non-resonant sub-terahertz detection by all studied III-V (GaAs, GaN) and silicon based transistors. Field effect transistors were recently proposed as the best terahertz detecting pixels for fabrication of low cost focal plane arrays for terahertz imaging. This article gives prospects for electrical simulation of these transistors and their optimal integration in the focal plane arrays.

Non-resonant terahertz detection in strained-Si modulation doped field effect transistors: first terahertz imaging