We report picosecond acoustic measurements of longitudinal sound dispersion and attenuation in an amorphous SiO2 layer at temperatures from 20 to 300 K over frequencies ranging from about 40 to 200 GHz. The sample is a radio frequency cathodic sputtered silica layer grown on a sapphire substrate with an aluminum filmtransducer deposited on top. Acoustic attenuation is evaluated from the simultaneous analysis of three successive echoes using transfer matrix calculation. Results are found to follow rather well a model combining coupling to thermally activated relaxations of structural defects and interactions with thermal vibrations. This leads to a nontrivial variation of the attenuation coefficient with frequency and temperature. The number density of relaxing defects in the SiO2 layer is found to be slightly higher than that in bulk v-SiO2. In contrast, similar anharmonic contribution to acoustic absorption is observed in both systems. The velocity variations are also measured and are compared to the dynamical velocity changes deduced from the sound attenuation.

Nowadays powerful X-ray sources like synchrotrons and free-electron lasers are considered as ultimate tools for probing microscopic properties in materials. However, the correct interpretation of such experiments requires a good understanding on how the beam affects the properties of the sample, knowledge that is currently lacking for intense X-rays. Here we use X-ray photon correlation spectroscopy to probe static and dynamic properties of oxide and metallic glasses. We find that although the structure does not depend on the flux, strong fluxes do induce a non-trivial microscopic motion in oxide glasses, whereas no such dependence is found for metallic glasses. These results show that high fluxes can alter dynamical properties in hard materials, an effect that needs to be considered in the analysis of X-ray data but which also gives novel possibilities to study materials properties since the beam can not only be used to probe the dynamics but also to pump it.

High-pressure polarized Raman spectra of vitreous silica are measured up to 8 GPa in a diamond-anvil cell at room temperature. The combined use of either a non-penetrating pressurizing medium, argon, or a penetrating one, helium, allows to separate density from stress effects on the Raman frequencies. In the framework of a simple central force model, the results emphasize the distinct role played by the shrinkage of the inter-tetrahedral angle Si-O-Si and the force-constant stiffening during the compression. The polarization analysis further reveals the existence of an additional isotropic component in the high frequency wing of the Boson peak. The pressure dependence of the genuine Boson peak frequency is found to be much weaker than previously reported and even goes through a minimum around 2 GPa in a remarkable coincidence with the anomalous compressibility maximum of silica.

We investigate vitreous silica pressurized under the noble gases, He, Ne and Ar by both spectroscopic techniques and numerical simulations. We find an unexpectedhuge solubility of He and Ne at high pressure together with a large decrease of the static compressibility. We show that this relates to the open and flexible structure of the glass allowing gas atoms to distend the network, the same way a porous material deform upon fluid adsorption. This behavior can be rationalized using generalized poromechanical constitutive equations. Direct optical microscopy observations highlight the swelling of the silica network upon fluid adsorption. Very sharp diffusion front of the fluid into the silica the sample is further observed indicating non trivial kinetics of the diffusing atoms. In the Ne case, adsorption-desorption kinetics canbe tracked by Brillouin spectroscopy.