We report hyperspectral microscopy in sp2-bonded boron nitride polytypes with a simultaneous inspection of the photoluminescence signal in the UV-C and UV-B spectral ranges. By comparing two different polytypes extracted from the same polycrystalline sample, we reveal that the well-known “4 eV defect” does not emit at the same energy for polytypes in the AB and AA′ stackings. The zero-phonon line is either at 4.14 or 4.16 eV for the noncentrosymmetric AB stacking, instead of the usual 4.09 eV energy in the AA′ stacking. Our results open the way for different characterization methods of the stacking order in sp2-bonded boron nitride, and bring alternative inputs for the elucidation of the atomistic configuration of points defects by advanced ab initio calculations.

We study the deep-ultraviolet emission in Bernal boron nitride as a function of temperature. The quasidegeneracy of indirect and direct excitons in Bernal boron nitride leads to their simultaneous recombination, allowing a comparison of phonon-assisted broadening in the two cases. Temperature-dependent measurements reveal that below 200 K, the efficiency of phonon-assisted broadening is one order of magnitude lower for the direct transition at 6.035 eV than for the phonon replicas of the indirect exciton. This striking effect results from the inhibition of quasielastic acoustic phonon scattering in the strong-coupling regime of the light-matter interaction, where the density of final states is reduced by the curvature of the polaritonic dispersion.

InGaN/GaN single quantum wells were grown by molecular beam epitaxy on the silicon substrate onto thin AlN and GaN buffer layers. The InGaN/GaN structure is porosified using a combination of SixNy nanomasking and sublimation and compared with a non-porous reference. The photoluminescence efficiency at room temperature of the porosified sample is improved by a factor reaching 40 compared with the reference sample. Plan-view and cross-sectional transmission electron microscopy images reveal that the remaining material is free of dislocation cores. The regions around dislocations are, thus, preferentially sublimated. This explains the strong photoluminescence improvement of nanoporous InGaN/GaN samples.

The sp2-bonded layered compound boron nitride (BN) exists in more than a handful of different polytypes (i.e., different layer stacking sequences) with similar formation energies, which makes obtaining a pure monotype of single crystals extremely tricky. The co-existence of polytypes in a similar crystal leads to the formation of many interfaces and structural defects having a deleterious influence on the internal quantum efficiency of the light emission and on charge carrier mobility. However, despite this, lasing operation was reported at 215 nm, which has shifted interest in sp2- bonded BN from basic science laboratories to optoelectronic and electrical device applications. Here, we describe some of the known physical properties of a variety of BN polytypes and their performances for deep ultraviolet emission in the specific case of second harmonic generation of light.

The presence of metastable Bernal stacking boron nitride is verified by combining second harmonic generation (SHG) and photoluminescence (PL) spectroscopy. The scanning confocal cryomicroscope, operating in the deep-ultraviolet range, shows a one-to-one correlation between inversion symmetry breaking probed by SHG and the detection of an intense PL line at ∼6.035 eV, the specific signature of the noncentrosymmetric Bernal stacking. The coherent character of the Bernal phase in boron nitride crystals is demonstrated by two-photon excitation spectroscopy. Direct and indirect excitons are simultaneously detected in the emission spectrum; they are quasi-degenerate, in agreement with theoretical predictions for Bernal boron nitride. The transition from AA′ to AB stacking is characterized by an intense emission from stacking faults at the grain boundaries of hexagonal and Bernal boron nitride crystals.