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We report the successful infilling of opal which consists of a fee arrangement of silica spheres with the semiconductor GaN by MOCVD technique. The angular dispersion of the Bragg diffracted light was studied for bare opal and GaN infilled opal by measuring reflection spectra at different external angles with respect to the [1 1 1] direction. The Bragg's law gives an estimation of 4.5% of void volume filled by the GaN. The crystal inhibits the yellow emission of GaN in the energies of the photonic gap. This decrease in the PL signal has one strong sensibility to the collection angle variation. This dependence is a signature of the GaN inside the opal voids.