Terahertz investigation of high quality indium nitride epitaxial layers Auteur(s): Meziani Ym, Maleyre Benedicte, Sadowski Ml, Ruffenach S., Briot O., Knap W. (Article) Publié: Physica Status Solidi A, vol. 202 p.590-592 (2005) Texte intégral en Openaccess : Ref HAL: hal-00540412_v1 DOI: 10.1002/pssa.200460434 WoS: 000228522300021 Exporter : BibTex | endNote 8 Citations Résumé: We report on the optical characterization of InN layers in the THz range and magnetic fields up to 13 T. The results are interpreted using the dielectric function formalism, with contributions of cyclotron resonance, phonons, plasmons and helicon wave excitations. We show how THz radiation transmission measurements can provide an optical contactless method of determining the quality (carrier density and momentum scattering rate) in the InN layers. (c) 2005 WILEY-VCH Verlag GmbH W Co. |