Measurement of film thickness up to several hundreds of nanometers using optical waveguide lightmode spectroscopy Auteur(s): Cuisinier Frédéric, Picart Catherine, Gergely C., Arntz Youri, Voegel Jean-Claude, Schaaf Pierre, Cuisinier Frédéric J.G., Senger Bernard (Article) Publié: Biosensors And Bioelectronics, vol. 20 p.553 - 561 (2004) Texte intégral en Openaccess : Ref HAL: hal-01743292_v1 DOI: 10.1016/j.bios.2004.03.005 WoS: 000225009000022 Exporter : BibTex | endNote 46 Citations |