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- Measurement of film thickness up to several hundreds of nanometers using optical waveguide lightmode spectroscopy doi link

Auteur(s): Cuisinier Frédéric, Picart Catherine, Gergely C., Arntz Youri, Voegel Jean-Claude, Schaaf Pierre, Cuisinier Frédéric J.G., Senger Bernard

(Article) Publié: Biosensors And Bioelectronics, vol. 20 p.553 - 561 (2004)
Texte intégral en Openaccess : istex