Exciton localization on basal stacking faults in a-plane GaN probed by picosecond time-resolved cathodoluminescence. Auteur(s): Corfdir Pierre, Lefebvre P., Ristic J., Dussaigne Amélie, Sonderegger Samuel, Martin Denis, Ganière Jean-Daniel, Grandjean N., Deveaud-Plédran Benoit (Affiches/Poster) Int. Conf. On Optics of Excitons in Confined Systems - OECS11. (Madrid, ES), 2009-09-07 Ref HAL: hal-00797193_v1 Exporter : BibTex | endNote Résumé: We examine the capture dynamics of excitons by basal stacking faults in a-plane GaN by using time-resolved CL. |