Ref HAL: hal-00903704_v1
DOI: 10.1016/j.sse.2012.05.047
WoS: 000309313600020
Exporter : BibTex | endNote
60 Citations
Résumé:

We report on ultrahigh sensitive, broadband terahertz (THz) detectors based on asymmetric double-grating-gate (ADGG) high electron mobility transistors, demonstrating a record responsivity of 2.2 kV/W at 1 THz with a superior low noise equivalent power of 15 pW/v Hz using InGaAs/InAlAs/InP material systems. When THz radiation is absorbed strong THz photocurrent is first generated by the nonlinearity of the plasmon modes resonantly excited in undepleted portions of the 2D electron channel under the high-biased sub-grating of the A-DGG, then the THz photovoltaic response is read out at high-impedance parts of 2D channel under the other sub-grating biased at the level close to the threshold. Extraordinary enhancement by more than two orders of magnitude of the responsivity is verified with respect to that for a symmetric DGG structure