--------------------
- Emission and detection of terahertz radiation using two-dimensional plasmons in semiconductor nanoheterostructures for nondestructive evaluations doi link

Auteur(s): Otsuji Taiichi, Watanabe Takayuki, Tombet Stephane Albon Boubanga, Satou Akira, Ryzhii Victor, Popov Vyacheslav, Knap W.

(Article) Publié: Optical Engineering, vol. 53 p.031206 (2014)
Texte intégral en Openaccess : openaccess


Ref HAL: hal-00954505_v1
DOI: 10.1117/1.OE.53.3.031206
WoS: 000329571000005
Exporter : BibTex | endNote
27 Citations
Résumé:

The recent advances in emission and detection of terahertz radiation using two-dimensional (2-D) plasmons in semiconductor nanoheterostructures for nondestructive evaluations are reviewed. The 2-D plasmon resonance is introduced as the operation principle for broadband emission and detection of terahertz radiation. The device structure is based on a high-electron-mobility transistor and incorporates the authors' original asymmetrically interdigitated dual-grating gates. Excellent THz emission and detection performances are experimentally demonstrated by using InAlAs/InGaAs/InP and/or InGaP/InGaAs/GaAs heterostructure material systems. Their applications to nondestructive material evaluation based on THz imaging are also presented.