Auteur(s): Abautret Yannick, Coquillat D., Zerrad Myriam, Bendoula Ryad, Soriano Gabriel, Heran Daphne, Grezes-Besset Bruno, Chazallet Frédéric, Amra Claude
Conference: TERAHERTZ, RF, MILLIMETER, AND SUBMILLIMETER-WAVE TECHNOLOGY AND APPLICATIONS XIII, 2020 (San Francisco, US, 2020)
Actes de conférence: Proceedings of SPIE, vol. 11279 p.112790L (2020)
Texte intégral en Openaccess : 
Ref HAL: hal-02978005_v1
DOI: 10.1117/12.2543710
WoS: WOS:000576674300010
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Résumé:
We analyze Terahertz (THz) echoes by reflection on a sunflower leaf in order to evaluate the internal leaf structure (geometry, complex indices and thicknesses). The analysis is based on the thin film multilayer formalism in time and frequency domains. A high agreement is emphasized between experiment and theory, and we evaluate how realistic the multilayer solution can be in regard to our knowledge related to the sunflower leaf. A test campaign is performed in Charles Coulomb laboratory, which is equipped with the THz spectrometer.