Ref HAL: hal-03034438_v1
DOI: 10.1016/j.carbon.2020.03.027
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Résumé:

The so-called buffer layer (BL) is a carbon rich reconstructed layer formed during SiC (0001) sublimation.The covalent bonds between some carbon atoms in this layer and underlying silicon atoms makes itdifferent from epitaxial graphene. We report a systematical and statistical investigation of the BLsignature and its coupling with epitaxial graphene by Raman spectroscopy. Three different BLs arestudied: bare buffer layer obtained by direct growth (BL0), interfacial buffer layer between graphene andSiC (c-BL1) and the interfacial buffer layer without graphene above (u-BL1). To obtain the latter, wedevelop a mechanical exfoliation of graphene by removing an epoxy-based resin or nickel layer. The BLsare ordered-like on the whole BL growth temperature range. BL0 Raman signature may vary from sampleto sample but forms patches on the same terrace. u-BL1 share similar properties with BL0, albeit withmore variability. These BLs have a strikingly larger overall intensity than BL with graphene on top. Thesignal high frequency side onset upshifts upon graphene coverage, unexplainable by a simple straineffect. Two fine peaks (1235, 1360 cm1), present for epitaxial monolayer and absent for BL and transferred graphene. These findings point to a coupling between graphene and BL.