Auteur(s): Tiberj A., Martin Fernandez M., Camara N., Poncharal Philippe, Michel T., Sauvajol J.-L., Godignon P., Camassel J.
Conference: 7th European Conference on Silicon Carbide and Related Materials (Barcelona (SPAIN), ES, 2008-09-07)
Actes de conférence: SILICON CARBIDE AND RELATED MATERIALS 2008, vol. 615-617 p.215-218 (2009)
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Résumé:
We report an investigation of few layers graphene exfoliated on SiC. Using AFM and Raman spectroscopy, we find that the graphene thickness determined from the normalized intensity of Raman lines significantly depart from the one obtained using XPS.