We report on resonant and non-resonant (broad-band) detection of terahertz (THz) radiation using Strained-Si MODFETs. The devices were excited at room temperature by two types of THz sources at 0.292 THz and at 1.5 THz. Non-resonant response with maxima around the threshold voltage was observed. Shubnikov-de Haas along with photoresponse measurements were performed simultaneously to demonstrate that the observed response is related to the plasma waves oscillation in the channel. The device was cooled down to 4.2 K and resonant signature could be observed.

The nonresonant detection of terahertz detectors based on asymmetric dual-grating-gate (A-DGG) high electron mobility transistors has been reported at both terahertz and sub-terahertz frequencies in several papers; but its behavior could not be fully understood in the range of the gate voltages close to and below the threshold voltage Vth. Two different contributions can attenuate the photoresponse u in the sub-threshold voltage region. The model developed in Ref. 3 showed that the gate leakage current suppresses the detector terahertz photoresponse in the sub-threshold region, leading to a nonresonant maximum in photoresponse versus gate dependence. While, in the model of Ref. 4, the detector loading effects were considered as responsible for the signal drop in the sub-threshold range. These effects are related to the voltage divider formed by input impedance of the measurement apparatus and the channel resistance of the detector which is exponentially increasing below threshold [4]. In the framework of the ANR-JST WITH project, we performed detailed studies of both the voltage u and the current i photoresponse of A-DGG devices. The photoresponse i was determined using the transfer characteristics measured with and without applied terahertz radiation. The measurements were carried out as a function of gate voltage and temperature (4 - 300 K), for incoming radiation frequencies of 292 and 655 GHz. As a result, we show that both effects are important and their relative contributions depend on gate voltage and temperature. We determine the separate contributions of the gate leakage current and the loading effect to the terahertz rectification signal in the sub-threshold region.

In this work, we undertake detailed studies of the mesoscopic rectification of an ac current at THz frequency induced by the incoming radiation for back-gated graphene field effect transistors. Using THz detection as a probe, we explore the nonlinear behavior of the quantum fluctuations and weak localization.

Semiconductor nanowires (NWs) represent an ideal building block for implementing rectifying diodes or plasma­ wave detectors that could operate well into the THz, thanks to the typical attofarad-order capacitance. Despite the strong effort in developing these nanostructures for a new generation of complementary metal-oxide semi­ conductors (CMOS), memory and photonic devices, their potential as radiation sensors into the Terahertz is just starting to be explored. We report on the development of NW-based field effect transistors operating as high sensitivity THz detectors in the 0.3 - 2.8 THz range. By feeding the radiation field of either an electronic THz source or a quantum cascade laser (QCL) at the gate-source electrodes by means of a wide band dipole antenna, we measured a photovoltage signal corresponding to responsivity values up to 100 V IW, with impressive noise equivalent power levels < 6 x 10-11W/Hz at room temperature and a > 300kHz modulation bandwidth. The potential scalability to even higher frequencies and the technological feasibility of realizing multi-pixel arrays coupled with QCL sources make the proposed technology highly competitive for a future generation of THz detection systems.

We present the realization of high electron mobility transistors on GaN-heterostructures usable for mixing and rectification in the THz range. Device fabrication is fully compatible with industrial processes employed for millimetre wave integrated circuits. On-chip, integrated, polarization-sensitive, planar antennas were designed to allow selective coupling of THz radiation to the three terminals of field effect transistors in order to explore different mixing schemes for frequencies well above the cutoff frequency for amplification. The polarization dependence of the spectral response in the 0.18-0.40 THz range clearly demonstrated the possible use as integrated heterodyne mixers

The reflection, transmission and absorbance spectra of silicon nanowire arrays (NWAs), as a function of the length of the nanowires, are investigated in a wavelength range of 15 μm < λ < 200 μm, using Fourier transform infrared spectroscopy in vacuum. The NWAs are fabricated using metal-assisted electroless chemical etching. The wire length is varied between 20 μm and 140 μm, which is of the same order of magnitude as the wavelength, and their spectra are compared to bulk Si. At high frequencies the absorbance spectra of the NWAs show molecular resonances due to adsorption of molecules involved in the fabrication process but also due to the oxide quality that wraps the nanowires and changes as a function of nanowire length. Transmission characteristics show an increasing shift in absorption band edge towards the far infrared for longer wires and a transition from specular to diffuse reflection at a nanowire length of approximately 60 μm.

Double-grating-gate field-effect transistors have a great potential as terahertz detectors. The double grating gate serves not only for carrier density tuning but also as an efficient THz radiation coupler. Low and high magnetic field detection results are used to determine the electron mobility and electron concentration, respectively, in the different parts of the channel.