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(219) Production(s) de COQUILLAT D.
The Italian TeraHertz Applications Auteur(s): Palma F, Coquillat D., Gavelli M., Raimondo N., Teppe F., Scorpigno R., Knap W.
Conférence invité: International, TeraNano &GDRI Workshop (, JP, 2011-11-24) |
Terahertz Field Effect Transistor Oscillators: From Plasma Wave HEMTs Emitters to Si-CMOS Detectors Arrays Auteur(s): Knap W., Coquillat D., Diakonova N., Torres J., Teppe F.
Conférence invité: International TeraNano &GDRI Workshop (Osaka, JP, 2011-11-24) |
Plasmonic Terahertz Ratchet Effect in a Periodically Gated 2D Electron System Auteur(s): Popov V. V., Fateev D. V., Otsuji T., Meziani Y. M., Coquillat D., Knap W.
Conférence invité: International TeraNano &GDRI Workshop (, JP, 2011-11-24) |
Terahertz radiation rectification as a probe of universal conductance fluctuations in graphene, Teranano2011 (Invited paper),Extended Abstract 1(1) 25I-N-10 (2011). Auteur(s): Coquillat D., Diakonova N., Poumirol Jean-Marie, Goiran Michel, Escoffier Walter, Raquet Bertrand, Teppe F., Dyakonov M., Knap W.
Conférence invité: International TeraNano &GDR-I THz Workshop (Osaka, JP, 2011-11-24) |
Field Effect Transistors for Terahertz Detection and Emission Auteur(s): Knap W., Nadar S., Videlier H., Boubanga-Tombet Stephane, Coquillat D., Diakonova N., Teppe F., Karpierz Kristoph, Lusakowski Jerzy, Sakowicz Maciej, Kasalynas Irmantas, Seliuta Dalius, Valusis Gintaras, Otsuji Taiichi, Meziani Yahya, El Fatimy A., Vandenbrouk Simon, Madjour Kamel, Theron Didier, Gaquière Christophe (Article) Publié: Journal Of Infrared, Millimeter And Terahertz Waves, vol. 32 p.618-628 (2011) Texte intégral en Openaccess : |
Terahertz Imaging with InP High-electron-mobility Transistors Auteur(s): Watanabe Takayuki, Akagawa Keisuke, Tanimoto Yudai, Coquillat D., Knap W., Otsuji Taiichi
Conference: TERAHERTZ PHYSICS, DEVICES, AND SYSTEMS V: ADVANCE APPLICATIONS IN INDUSTRY AND DEFENSE (, US, 2011-04-25) |
A 280-GHz Schottky Diode Detector in 130-nm Digital CMOS Auteur(s): Han Ruonan, Zhang Yaming, Coquillat D., Videlier H., Knap W., Brown Elliott, Kenneth K. O. (Article) Publié: Ieee Journal Of Solid-State Circuits, vol. 46 p.2602-2612 (2011) |