An overview of main results concerning THz detection related to plasma nonlinearities in nanometer field effect transistors is presented. In particular nonlinearity and dynamic range of these detectors are discussed. As the main result, we will show some of the first real-world applications of the FET THz detectors: demonstrators of the imager developed for fast postal security and industrial nondestructive quality control.

Recent advances in THz detection with the use of CMOS technology have shown that this option has the potential to be a leading method of producing low-cost THz sensors with integrated readout systems. This review paper, based on authors’ years of experience, presents strengths and weaknesses of this solution. The article gives examples of some hints, regarding radiation coupling and readout systems. It shows that silicon CMOS technology is well adapted to the production of inexpensive imaging systems for sub-THz frequencies. As an example paper presents the demonstrator of a multipixel Si-CMOS THz spectroscopic system allowing for chemical identification of lactose. The THz detectors embedded in this system were manufactured using the CMOS process.

A graphene ballistic rectifier is used in conjunction with an antenna to demonstrate a terahertz (THz) detector and imager. The device is used to take an image of an optically opaque object at 0.68 THz demonstrating potential in both medical and security imaging applications.

We present experimental studies of terahertz radiation detection by InP double heterojunction based transistors. We analyze the relation between their static characteristics and the experimentally determined voltage and current responsivities, showing importance of internal device parasitic capacitances and the external circuit loading effects. Finally, we demonstrate the use of these transistors for terahertz radiation computed tomography leading to 3D visualization of concealed objects. Our results pave the way towards wide use of heterojunction based transistors for terahertz imaging.

An electromagnetic wave detector comprises a field effect transistor, an antenna 601 connected to a first end of a gate 608 of the field effect transistor for receiving incident electromagnetic waves, and a biasing connection pad 605 connected to a second end of the gate 608 for applying a bias voltage to the transistor. The antenna may have a first part 601b connected to the first end of the gate 608 and a second part 601a connected to a source 602 of the transistor. The detector may further comprise a virtual ground element 607 connected to the second end of the gate 608. A control module may control the bias voltage applied on the biasing connection pad 605 according to the electromagnetic power received by the detector. The transistor may be a high electron mobility transistor (HEMT).

At least one electronic device, system and method of manufacturing an electromagnetic wave detector are provided herein. The electronic device for receiving at least one electromagnetic wave of a given frequency may comprise at least one first field effect transistor, and at least one antenna configured to receive the at least one electromagnetic wave and connected to a gate of the at least one first field effect transistor, wherein a length of the gate is in a same order of magnitude as an oscillation length of an oscillation regime of the at least one first field effect transistor at the given frequency, and a width of the gate is such that an impedance presented by the at least one first field effect transistor in the oscillation regime is adapted to an impedance of the at least one antenna.