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(227) Production(s) de TEPPE F.
Imaging above 1 THz Limit with Si-MOSFET Detectors Auteur(s): Schuster F., Videlier H., Sakowicz M., Teppe F., Coquillat D., Dupont B., Siligaris A., Dussopt L., Giffard B., Knap W.
Conference: 35th International Conference on Infrared, Millimeter and Terahertz Waves (Rome, IT, 2010-09-05) |
Room Temperature Imaging above one Terahertz by Field Effect Transistor as Detector Auteur(s): Nadar S., Coquillat D., Sakowicz M., Videlier H., Klimenko O., Teppe F., Diakonova N., Knap W., Seliuta D., Kasalynas I., Valusis G.
Conference: 35TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ 2010) (Rome (ITALY), FR, 2010-09-05) |
Field effect transistors for terahertz detection - silicon versus III-V material issue Auteur(s): Knap W., Videlier H., Nadar S., Coquillat D., Diakonova N., Teppe F., Bialek M., Grynberg M., Karpierz K., Lusakowski J., Nogajewski K., Seliuta D., Kašalynas I., Valušis G. (Article) Publié: Opto-Electronics Review, vol. 18 p.225-230 (2010) Texte intégral en Openaccess : |
Room temperature detection of sub-terahertz radiation in double-grating-gate transistors Auteur(s): Coquillat D., Nadar S., Teppe F., Diakonova N., Boubanga-Tombet S., Knap W., Nishimura T., Otsuji T., Meziani Y., Tsymbalov G., Popov V. (Article) Publié: Optics Express, vol. 18 p.6024 (2010) |
Terahertz response of InGaAs field effect transistors in quantizing magnetic fields Auteur(s): Klimenko O., Mityagin Yu., Videlier H., Teppe F., Diakonova N., Consejo C., Bollaert Sylvain, Murzin V., Knap W. (Article) Publié: Applied Physics Letters, vol. 97 p.022111 (2010) |
Room temperature imaging at 1.63 and 2.54 THz with field effect transistor detectors Auteur(s): Nadar S., Videlier H., Coquillat D., Teppe F., Sakowicz M., Diakonova N., Knap W., Seliuta D., Kasalynas Irmantas, Valusis Gintaras (Article) Publié: Journal Of Applied Physics, vol. 108 p.054508 (2010) |
Influence of Shubnikov de Haas and cyclotron resonance effect on terahertz detection by field effect transistors Auteur(s): Boubanga-Tombet S., Teppe F., Diakonova N., Coquillat D., Knap W., Karpierz K., Lusakowski J., Grynberg M., Dyakonov M.
Conference: 15th International Semiconducting and Insulating Materials Conference (SIMC-XV) (Vilnius, LT, 2009-06-15) |